Latest / MRS Bulletin Materials News Podcast
Episode 19: 4D-STEM measures thermal properties of 2D materials
In this podcast episode, MRS Bulletin’s Laura Leay interviews Michael Pettes, deputy group leader and staff scientist at the Center for Integrated Nanotechnologies in Los Alamos National laboratory about a characterization technique that employs a four-dimensional scanning transmission electron microscope (4D-STEM) paired with complex computational data analysis to directly measure the thermal expansion coefficient (TEC) of monolayer epitaxial tungsten diselenide. The standard technique for directly measuring the TEC involves X-ray diffraction, but 2D materials are too thin. 4D-STEM uses a…
The skinny
The skinny isn't ready yet — notes appear once the transcript is processed.